Reliability and Diagnostics. in Electronics
5 ECTS
(3 hours classes, 2 hours labs)
Content: Fundamentals of diagnostics, methods of test generation : detection and localization tests, tests for combinatorial circuits, tests for sequential circuits, test minimization, scan methods, boundary scan, error detecting and correcting codes : self-checking circuits, theory of linear codes, cyclic codes, Hamming codes, Read-Solomon codes, principles of totally self-checking circuit design: alternating logic, two-wire logic, principles of fault tolerant circuit design, testing of systematic structures: memory chip testing, VLSI chips testing: microprocessors, peripheral chips and other VLSI chips; testing devices : troubleshooters, signature analyzers, logic analyzers, digital oscilloscopes, in-circuit emulators, small and large testers.